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KSPB
Semiconductor Strain Gages
The KSPB series gages are stable-performance semiconductor strain gages usable for general stress measurement and transducers. The F2 type has a half-bridge formed with a 2-element structure (Positive and Negative), for self-temperature compensation and is suitable for strain measurement of steel products.
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Main Specifications
Materials Resistive element 1-element: P type Si Materials Base Polyimide Operating temperature in combination with major adhesives after curing (°C) CC-33A: -50 to 120ºC Operating temperature in combination with major leadwire cables (°C) - Self-temperature-compensation (°C) 1-element: - Applicable linear expansion coefficients (×10-6/℃) 1-element: - Strain limits at normal temp. (approx. %) 1-element: 0.3 Fatigue lives at normal temp. (times) 2 x 106 (±1000 μm/m)Major Properties
2-element: P type Si and N type Si (2-element structure)
EP-340: -50 to 150ºC
2-element: 20 to 50
2-element: 11
2-element: 0.15
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